Sep 7 – 11, 2026
Buenos Aires, Argentina
America/Argentina/Buenos_Aires timezone

SNS Survey, Alignment, and Metrology

Sep 9, 2026, 2:40 PM
10m
Buenos Aires, Argentina

Buenos Aires, Argentina

IFIByNE (CONICET-UBA) - Intendente Güiraldes 300 Buenos Aires Autonomous City of Buenos Aires
Poster Presentation Mechanical structures POSTER SESSION

Speaker

Derek Doane (Oak Ridge National Laboratory (Spallation Neutron Source))

Description

This poster will present the precision measurement and alignment capabilities of the Survey, Alignment, and Metrology Group at the Spallation Neutron Source (SNS). Our team provides high accuracy geometric characterization across both accelerator systems and neutron beamlines, supporting reliable operations and enabling consistently high quality neutron production. Core activities include detailed mapping and fiducialization of accelerator and beamline components, development of stable geometric reference frames, and application of rigorous coordinate system transformations to generate ideal alignment points for installation, verification, and long term stability.
In addition to direct support for SNS systems, the poster highlights the group’s contributions to broader laboratory initiatives such as isotope enrichment programs and fusion energy research. Our metrology capabilities include comprehensive dimensional inspections, uncertainty driven measurement assessments, and advanced 3D scanning workflows that enable reverse engineering of complex or legacy components. Through the integration of precision measurement technologies and robust geometric modeling, the Survey, Alignment, and Metrology Group provides essential alignment, characterization, and design support that underpins mission critical scientific and engineering activities across Oak Ridge National Laboratory.

Key Words

Survey, Alignment, & Metrology

Other Survey, Alignment, & Metrology

Author

Derek Doane (Oak Ridge National Laboratory (Spallation Neutron Source))

Presentation materials

There are no materials yet.