Sep 7 – 11, 2026
Buenos Aires, Argentina
America/Argentina/Buenos_Aires timezone

Proof-of-Concept Demonstration of a Polychromatic Multiplexed Neutron Stress–Strain Diffractometer at the MIT Reactor

Sep 9, 2026, 3:00 PM
10m
Buenos Aires, Argentina

Buenos Aires, Argentina

IFIByNE (CONICET-UBA) - Intendente Güiraldes 300 Buenos Aires Autonomous City of Buenos Aires
Poster Presentation Neutron optics POSTER SESSION

Speaker

Dr Jay T. Cremer (Adelphi Technology Inc.)

Description

Engineering diffractometers at reactor neutron sources typically use monochromatic beams and scan detectors through 2θ to measure selected Bragg reflections. Because the scattering angle varies among reflections, this geometry can produce asymmetric, reflection-dependent gauge volumes. In contrast, time-of-flight engineering diffractometers commonly use detector banks fixed near 90°, providing a consistent gauge-volume geometry across multiple reflections. Reproducing this fixed-angle configuration at a reactor source requires a polychromatic incident beam coupled with analyzer-detector pairs. Focusing analyzers positioned at approximately ±90^∘ define a fixed gauge volume. Multiplexing is demonstrated by arranging multiple analyzer–detector pairs sequentially, with each analyzer tuned to a selected Bragg reflection and its curvature set to satisfy the focusing condition for the specific analyzer–detector geometry. In this poster, we present a proof-of-concept demonstration of this instrument configuration at the MIT Reactor. We verified the focusing condition for bent-perfect silicon analyzers and demonstrated diffraction measurements from graphite using two in-line analyzers.

Key Words

Polychromatic
Stress-strain
Multiplexing
Focusing
Bent-perfect crystal

Authors

Dr Jay T. Cremer (Adelphi Technology Inc.) Dr Sean Fayfar (Massachusetts Institute of Technology) Dr Boris Khaykovich (Massachusetts Institute of Technology)

Presentation materials

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